SN74AHCT1G02DCKR类似电子元器件：

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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74AHCT1G02DCKR PDF资料和参数原理简介

品牌 : TI

封装形式 : DCK

引脚数量 : 5

温度范围 : 最小 -40 °C | 最大 85 °C

文件大小 : 74 KB

功能应用 : SINGLE 2-INPUT POSITIVE-NOR GATE