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SN74LVC112ADBLE是什么作用： DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET
SN74LVC112ADBLE类似电子元器件：
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- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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- SN74AHC541PWR
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- DUAL 5-INPUT POSITIVE-NOR GATES
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- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
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- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
- SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
- SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SN74LVC112ADBLE PDF资料和参数原理简介
品牌 : TI
封装形式 : DB
引脚数量 : 16
温度范围 : 最小 -40 °C | 最大 85 °C
文件大小 : 140 KB
功能应用 : DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP WITH CLEAR AND PRESET
SN74LVC112ADBLE PDF资料下载
