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SN74LVTH18514DGGR是什么作用： 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18514DGGR类似电子元器件：
- SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
- SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
- SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
- SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
- SN74LVTH16652DLR
- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
- SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
- SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
- SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SN74LVTH18514DGGR PDF资料和参数原理简介
品牌 : TI
封装形式 : DGG
引脚数量 : 64
温度范围 : 最小 -40 °C | 最大 85 °C
文件大小 : 602 KB
功能应用 : 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18514DGGR PDF资料下载
